CT9 Atomic Force Microscopy

Probe microscopy is a general term for a class of microscopy in which well-defined nanoscale probes are used to interact with a sample in some manner. In this introductory lecture the necessary background principles to understand probe microscopy are explained with reference to Scanning Tunnelling Microscopy and Atomic Force Microscopy in both tapping and contact mode. This will provide the user with the necessary background to make the most of the increasingly well-used Departmental Keysight 5500 multimode system, which is operated and maintained by the Melville Lab. Probe microscopy is of interest to anyone with a need to perform single molecule or surface based studies. Typically anything involving a surface interaction is accessible and the technique is particularly well suited to studying a variety of chemical and electromechanical properties of aggregates with 1-1000 nm dimensions. Recently, the system has been used to study cellulose crystals, amyloid fibres, protein monolayers, thermal properties of polymer films, doped graphite and so on.

Other modes are available on the Keysight system such as pico-trec, electrochemical STM, EFM, KFM, MFM, and LFM and these modes will be described but not explained in detail during the lecture.

Number of sessions: 2

The Characterisation Techniques lectures introduce and focus upon facilities available in the Department and will help to underpin your research in a very practical sense. These lectures will run annually in the Michaelmas Term to serve as a solid basis for those beginning to carry out experimental research in the Department. Attendance at these lectures will provide you with the ability to choose the right technique(s) to answer the questions that you have regarding the molecules and/or materials you have made. If you would like to know any further information about our Departmental Facilities, you may also look at the relevant web pages, which you will find at: http://www.ch.cam.ac.uk/analytical-data-services.